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Thermal Station
Thermal Analysis
Equipment: Mettler Toledo
TGA/SDTA
Use: The
instrument measures the mass of a sample as it varies with a
controlled temperature programme. Software is available to
generate both the TGA and the SDTA traces (Mettler).
Equipment: Perkin Elmer Thermal
Analysis System
Use: The
TG instrument measures the mass of a sample as it varies with
a controlled temperature programme. The DSC instrument
measures the difference in enthalpy between a sample and a
reference as it varies with a controlled temperature
programme.
XRD
Equipment:
Huber Imaging Plate Guinier Camera 670
Use: A compound
in the form of a powder is exposed to an X-ray beam. The
angular positions and the intensites of the diffracted beams
are recorded, producing a characteristic pattern.
Single Crystal XRD
Equipment:
Nonius Kappa CCD diffractometer
Use: A single
crystal is exposed to a beam of X-rays and the intensities
diffracted by the crystal are accurately measured. Subsequent
processing of the data and computation leads to determination
of the molecular and crystal structure of the material.
Single Crystal XRD
Bruker Kappa Apex II DUO CCD diffractometer
Use: A single
crystal is exposed to a beam of X-rays and the intensities
diffracted by the crystal are accurately measured. Subsequent
processing of the data and computation leads to determination
of the molecular and crystal structure of the material.
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